After decades of production and technology upgrades, domestic semiconductor manufacturing is toward the miniaturization. Meanwhile, the visual inspection is still maintaining a manual way, which also has received more customer questions and challenges. Based on this, the introduction of an automatic optical inspection (AOI) system is referring to critical positions. This system captures the pictures with an embedded microcontroller and color linearity CCD camera, and then products through filtering, edge detection to achieve the online detection, analyze and removing of defects. After production validated, the image capture, processing, and analysis of the system are accurate and reliable, and inspection/removing speed reach to 10pcs/sec.