Base on the SoC test application problems of builtin selftest (BIST) technology, this paper presents a design method of BIST for testing IP cores under IEEE 1500 standard. According to the test structure and norm of IEEE 1500 standard, this method discusses each modules of the test wrapper. Also, the instructions of test wrapper are accomplished in various operating modes. What's more, the structure and work flow of the test controller base on the BIST theory is designed. Finally, setting the eight bit adder as an example, function verification for this test system is achieved in the environment of Quartus II. Verification results show that IEEE 1500 wrapper is able to complete the transmission of instructions and data at the work of BIST controller. The function of testing IP cores is effective and feasible.