In order to solve the problem of multiobjective matching in the speed testing method of contact fragment, we proposed a wide point set matching algorithm based on the uniform point drift algorithm. Our algorithm first reduces the point set, and then the global optimal solution is obtained by using multiple EM iterative strategies and the important properties of the reduced points set. Finally, we can find the corresponding relationship of the point set measured in different test surface. Through the simulation analysis and comparison with other algorithms, it is proved that the algorithm proposed in this paper can solve the problem of burst speed.Our algorithm solves the problem that it is difficult to match the speed of each fragment in the fragment test model, which greatly improves the speed test accuracy of the chip group.