咸阳职业技术学院讲
TN407
咸阳职业技术学院科研名称:名称:基于LK8810平台的集成电路数字芯片测试方法设计与实现 (编号:2023KJB12)
由于集成电路数字芯片内部深层次逻辑的复杂性和边界条件的多样性，导致芯片功能测试覆盖率较低。因此，以提高芯片测试效果为目的，本文借助LK8810平台，对高效的数字芯片测试方法展开研究。首先，通过合理设置LK8810平台模拟信号的上升时间和下降时间以及测试条件，连接平台测试板和待测芯片的输入引脚，由此搭建集成数字芯片测试硬件电路。然后，利用LK8810自动测试系统内置的程序包和库函数设计测试用例和配置测试参数，由此生成芯片性能测试的程序，并对其进行缺陷密度检测。最后，结合测试环境准备、测试软件配置、测试顺序确定、测试执行以及芯片性能分析与评估等步骤设计芯片测试流程，进而完成芯片测试。实验结果表明：利用该方法对待测芯片展开功能测试，测试结果的覆盖率高达80%以上，源代码执行率最高可达到97.9%，说明该方法的测试可靠性较高。
Due to the complexity of deep logic and diversity of boundary conditions within integrated circuit digital chips, the coverage of chip functional testing is relatively low. Therefore, with the aim of improving the effectiveness of chip testing, this article uses the LK8810 platform to conduct research on efficient digital chip testing methods. Firstly, by reasonably setting the rise and fall times of the analog signal on the LK8810 platform and testing conditions, connecting the input pins of the platform test board and the chip under test, an integrated digital chip testing hardware circuit is constructed. Then, using the built-in program packages and library functions of the LK8810 automatic testing system, test cases are designed and test parameters are configured to generate a program for chip performance testing, and defect density detection is performed on it. Finally, the chip testing process is designed by combining the steps of testing environment preparation, testing software configuration, testing sequence determination, testing execution, and chip performance analysis and evaluation, in order to complete the chip testing. The experimental results show that using this method to conduct functional testing on the test chip, the coverage rate of the test results is over 80%, and the highest source code execution rate can reach 97.9%, indicating that the testing reliability of this method is high.
