Due to the complexity of deep logic and diversity of boundary conditions within integrated circuit digital chips, the coverage of chip functional testing is relatively low. Therefore, with the aim of improving the effectiveness of chip testing, this article uses the LK8810 platform to conduct research on efficient digital chip testing methods. Firstly, by reasonably setting the rise and fall times of the analog signal on the LK8810 platform and testing conditions, connecting the input pins of the platform test board and the chip under test, an integrated digital chip testing hardware circuit is constructed. Then, using the built-in program packages and library functions of the LK8810 automatic testing system, test cases are designed and test parameters are configured to generate a program for chip performance testing, and defect density detection is performed on it. Finally, the chip testing process is designed by combining the steps of testing environment preparation, testing software configuration, testing sequence determination, testing execution, and chip performance analysis and evaluation, in order to complete the chip testing. The experimental results show that using this method to conduct functional testing on the test chip, the coverage rate of the test results is over 80%, and the highest source code execution rate can reach 97.9%, indicating that the testing reliability of this method is high.