冷冰 谈恩民.基于IEEE 1500标准的IP核内建自测试设计[J].国外电子测量技术,2015,34(9):75-80
基于IEEE 1500标准的IP核内建自测试设计
Design of BIST testing IP core based on IEEE 1500 standard
  
DOI:
中文关键词:  IP核测试  内建自测试  IEEE 1500标准
英文关键词:IP core test  BIST  IEEE 1500 standard
基金项目:
作者单位
冷冰 谈恩民 桂林电子科技大学 电子工程与自动化学院 
AuthorInstitution
Leng Bing Tan Enmin Institute of Electrical Engineering and Automation,Guilin University of Electronic Technology 
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中文摘要:
      针对内建自测试(BIST)技术在SoC测试上的应用问题,提出了一种在IEEE 1500标准下对IP核的BIST设计方法。该方法根据IEEE 1500标准的测试结构和规范研究讨论了测试壳的各个组成单元,实现了测试壳在各种工作模式下的指令操作,并结合BIST的工作原理设计了测试控制器的结构和工作流程。最终以8位超进位加法器为例,在Quartus II环境下对整个测试系统进行了功能验证。验证结果表明,IEEE 1500测试壳可在BIST控制器作用下正确完成指令和数据传输,本设计对IP核的测试功能有效可行。
英文摘要:
      Base on the SoC test application problems of built in self test (BIST) technology, this paper presents a design method of BIST for testing IP cores under IEEE 1500 standard. According to the test structure and norm of IEEE 1500 standard, this method discusses each modules of the test wrapper. Also, the instructions of test wrapper are accomplished in various operating modes. What's more, the structure and work flow of the test controller base on the BIST theory is designed. Finally, setting the eight bit adder as an example, function verification for this test system is achieved in the environment of Quartus II. Verification results show that IEEE 1500 wrapper is able to complete the transmission of instructions and data at the work of BIST controller. The function of testing IP cores is effective and feasible.
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